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▣ 주   제: Characterization of micro- and nano-structures of materials using transmission electron microscopy

▣ 연   사: 조장현 박사

▣ 소   속: Forschungszentrum Jülich(독일 율리히 연구소)

▣ 일   시: 2023. 9. 21.(Thu) 11:00

▣ 장   소: 제1공학관 A681호

▣ 초   청: 이남규 교수

▣ 초   록

Structure-property relationship is a fundamental and central concept in materials science and engineering. Material structure has a broad range of length scales, from macro-scale architecture to microstructure of grains and defects, and even down to the atomic-scale showing atomic bonding and arrangement. Various properties of materials, such as mechanical, optical, electrical, and chemical properties, are derived from the structure of material. Therefore, it is of great importance to identify the structure of material to fully understand the structure-property relationship and thus to develop and design the high-quality material and device. Additionally, characterizing nanomaterials has recently become significant with the current development of nanotechnology, such as semiconductor devices with nanometer-sized transistors and catalyst based on nanoparticle. Electron microscopy has been successfully employed in numerous applications to characterize micro- and nano-structures of materials due to its diverse capabilities and high-resolution imaging performance. In this presentation, transmission electron microscopy(TEM) is introduced as a tool which enables multidisciplinary researches in physical, chemical, biological, and materials sciences. The diverse capabilities in TEM, such as imaging, diffraction, and spectroscopy, allow the instrument to investigate the characteristics of the specimen including the atomic-, micro-, and electronic-structures of materials. Advanced microscope techniques including in-situ experiments and electromagnetic field mapping will be also briefly introduced.